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XRF-to-Optical Field-of-View Localization with Vision Language Models

Authors: Xiangyu Yin, Tatjana Paunesku, Letonia Copeland-Hardin, Martina Ralle, Zichao Wendy Di, Si Chen, Gayle E. Woloschak, Barry Lai, Mathew J. Cherukara, Stefan VogtPublished: 2026-08-18Paper ID: 2608.18309Category: cs.CVLicense: CC BY 4.0

Abstract

Registering images acquired with different microscopy modalities is essential for relating complementary measurements of the same specimen. In correlative X-ray fluorescence (XRF) and optical microscopy, the XRF map often covers only a small region of an optical image acquired from the same or an adjacent tissue section. Field-of-view (FOV) localization is necessary but can be difficult when appearance and structure differ across modalities. Here we evaluate training-free vision language model (VLM) localization on two datasets representing same-section high-correspondence and adjacent-section low-correspondence imaging. We test unconstrained and metadata-constrained search and compare VLMs with geometric controls, classical template matching, and two alternative training-free approaches (DINOv2 and multiGradICON). Direct VLM prompting produced content-dependent spatial signals but was not reliable alone. Classical matching was most accurate when cross-modal structure was preserved but failed in the low-correspondence collection. A proposal-and-verify workflow used repeated VLM predictions as candidates and image-based similarity to select the final location. This workflow recovered useful localization in the low-correspondence regime.

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